Título
Synthesis, microstructural, optical and mechanical properties of yttria stabilized zirconia thin films
Autor
PATRICIA AMEZAGA MADRID
ABEL HURTADO MACIAS
WILBER ANTUNEZ FLORES
PEDRO PIZA RUIZ
MARIO MIKI YOSHIDA
Nivel de Acceso
Acceso Abierto
Materias
Resumen o descripción
Thin films of yttria-stabilized zirconia (YSZ) exhibit exceptional properties, such
as high thermal, chemical and mechanical stability. Here, we report the synthesis of
YSZ thin films by aerosol assisted chemical vapour deposition onto borosilicate glass
and fused silica substrates. Optimum deposition temperatura was 673±5 K. In addition,
different Y content was tried to analyse its influence in the microstructure and properties
of the films. The films were uniform, transparent and non-light scattering. Surface
morphology and cross sectional microstructure were studied by field emission scanning
electron microscopy. The microstructure of the films was characterized by grazing
incidence X-ray diffraction. Crystallite size and lattice parameter were obtained. Optical
properties were analysed from reflectance and transmittance spectra; from these
measurements, optical constants and band gap were obtained. Quantum confinement
effect, due to the small grain size of the films, was evident in the high band gap energy
obtained. Nanoindentation tests were realized at room temperature employing the
continuous stiffness measurement method, to determine the hardness and elastic
modulus as a function of Y content.
Fecha de publicación
2011
Tipo de publicación
Artículo
Versión de la publicación
Versión enviada
Recurso de información
Formato
application/pdf
Idioma
Inglés
Repositorio Orígen
Fuente de Objetos Científicos Open Access
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