Título

XANES and EXAFS study of the TiN Thin films grown by the pulsed DC sputtering technique assisted by balanced magnetron

Autor

JOSE ALBERTO DUARTE MOLLER

Colaborador

Hilda Esparza Ponce (Colaborador)

Nivel de Acceso

Acceso Abierto

Licencia

http://creativecommons.org/about/cc0/

Materias

TiN - (NITURATION) Thin films - (PLD) CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA - (CTI) FÍSICA - (CTI) OTRAS ESPECIALIDADES FÍSICAS - (CTI) OTRAS - (CTI)

Resumen o descripción

A series of different TixNy thin films were grown by the DC-sputtering technique. The purpose for this work was to study through XAS interpretation, how the different amounts of N2 during growing thin TiN thin films, affects the stoichiometry of the TiN deposited. Also the results obtained determinate how to interpret the spectra to see the different valences of Ti in TiN, are working. The results were supported with the EXAFS and XANES analysis. This work concludes the adequated conditions for this experiment to obtain TiN as thin film by the DC sputtering assited by pulsed balanced magnetron at room temperature and aconcludes which XANES spectra are the finger print for valences of Ti

Fecha de publicación

febrero de 2007

Tipo de publicación

Artículo

Versión de la publicación

Versión enviada

Recurso de información

http://cimav.repositorioinstitucional.mx/jspui/handle/1004/967

Formato

application/pdf

Idioma

Inglés

Repositorio Orígen

Fuente de Objetos Científicos Open Access

Descargas

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