Título
A test generation methodology for interconnection opens considering signals at the coupled lines
Autor
Roberto Gómez
ALEXANDRO GIRON ALLENDE
VICTOR HUGO CHAMPAC VILELA
Nivel de Acceso
Acceso Abierto
Materias
Interconnection opens - (INTERCONNECTION OPENS) Coupling capacitances - (COUPLING CAPACITANCES) Boolean testing - (BOOLEAN TESTING) Favorable logic conditions - (FAVORABLE LOGIC CONDITIONS) Test generation methodology - (TEST GENERATION METHODOLOGY) CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA - (CTI) FÍSICA - (CTI) ELECTRÓNICA - (CTI)
Resumen o descripción
Interconnection opens have become important defects in nanometer technologies. The behavior of these defects depends on the structure of the affected devices, the trapped gate charge and the surrounding circuitry. This work proposes an enhanced test generation methodology to improve the detectability of interconnection opens. This test methodology is called OPVEG. OPVEG uses layout information and a commercial stuck-at ATPG. Those signal values at the coupled lines which favor the detection of the opens, under a boolean based test, are attempted to be generated. The methodology is applied to four ISCAS85 benchmark circuits. The results show that a significant number of considered coupled signals are set to proper logic values. Hence, the likelihood of detection of interconnection opens is increased. The results are also given in terms of the amount of coupling capacitance having logic conditions favoring the defect detection. This shows the OPVEG benefits. Furthermore, those lines difficult to test can be identified. This information can be used by the designer to take design for test measures.
Editor
Springer Science + Business Media
Fecha de publicación
2008
Tipo de publicación
Artículo
Versión de la publicación
Versión publicada
Recurso de información
Formato
application/pdf
Idioma
Inglés
Audiencia
Estudiantes
Investigadores
Público en general
Sugerencia de citación
Gómez, R., et al., (2008). A test generation methodology for interconnection opens considering signals at the coupled lines, J Electron Test (24):529–538
Repositorio Orígen
Repositorio Institucional del INAOE
Descargas
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