Título
Permittivity measurements at microwave frequencies using Epsilon-Ear-Zero (ENZ) tunnel structure
Autor
Humberto Lobato Morales
ALONSO CORONA CHAVEZ
JOSE LUIS OLVERA CERVANTES
JUAN MARTINEZ BRITO
Nivel de Acceso
Acceso Abierto
Materias
Cavity perturbation methods - (CAVITY PERTURBATION METHODS) epsilon-near-zero (ENZ) - (EPSILON-NEAR-ZERO (ENZ)) Permittivity measurements - (PERMITTIVITY MEASUREMENTS) substrate integrated waveguide (SIW) - (SUBSTRATE INTEGRATED WAVEGUIDE (SIW)) CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA - (CTI) FÍSICA - (CTI) ELECTRÓNICA - (CTI) ELECTRÓNICA - (CTI)
Resumen o descripción
A planar epsilon-near-zero (ENZ) tunnel structure implemented on substrate integrated waveguide (SIW) technology is used to evaluate the complex dielectric permittivity of various materials. Design, optimization, and fabrication of the ENZ tunnel structure are explained. Simulations and measurements on various dielectric samples using the cavity perturbation technique of the proposed structure are presented. Measured values of the permittivity are in good agreement with standard values. Sensitivity analyses are performed on the ENZ structure and the conventional SIW cavity techniques. The proposed structure has very high sensitivity, which yields more accurate results when compared to other techniques, such as perturbation of conventional cavities.
Editor
IEEE
Fecha de publicación
2011
Tipo de publicación
Artículo
Versión de la publicación
Versión aceptada
Recurso de información
Formato
application/pdf
Idioma
Inglés
Audiencia
Estudiantes
Investigadores
Público en general
Sugerencia de citación
Lobato-Morales, H., et al., (2011). Permittivity measurements at microwave frequencies using Epsilon-Ear-Zero (ENZ) tunnel structure, IEEE Transactions on Microwave Theory and Techniques, Vol. 59 (7): 1863-1868
Repositorio Orígen
Repositorio Institucional del INAOE
Descargas
257