Título
Modeling of microwave transmission lines considering frequency-dependent current distribution effects
Autor
DIEGO MAURICIO CORTES HERNANDEZ
Colaborador
REYDEZEL TORRES TORRES (Asesor de tesis)
Nivel de Acceso
Acceso Abierto
Materias
Microwave transmission lines - (LÍNEAS DE TRANSMISIÓN DE MICROONDAS) Description of the RLGC model - (DESCRIPCIÓN DEL MODELO RLGC) Analysis on IC - (ANÁLISIS EN IC) Analysis on PCB - (ANÁLISIS EN PCB) CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA - (CTI) FÍSICA - (CTI) ELECTRÓNICA - (CTI) DISPOSITIVOS SEMICONDUCTORES - (CTI)
Resumen o descripción
This thesis is focused on the modeling and characterization of planar interconnects operating at microwave frequencies covering both, integrated circuit (IC) and printed circuit board (PCB) technologies. In particular, the state-of-the-art of the field is advanced by providing physically-based models incorporating the accurate representation of the series effects (i.e., resistance and inductance). In this regard, the current distribution effects, including the skin and proximity effects, are taken into consideration. The analysis starts with the premise that an accurate modeling of the metal losses in microwave transmission lines for IC and PCB technologies, including frequency-dependent current distribution effects is essential to predict the actual response of a whole transmission channel. From the resulting analysis, three frequency regions were identified, mathematical expressions that relate the cross-section and the electrical characteristics of the structure were developed, and the corresponding accuracy is verified through comparisons with simulations carefully performed on full-wave solvers. Furthermore, dominant effects within different frequency ranges were identified, which allows for the development of new methodologies for the electrical characterization of dielectric materials, and pad de-embedding. All the models and methodologies were applied to single-ended and differential microstrips and striplines, as well as to metal-insulator-metal (MIM) test fixtures used for the characterization of thin dielectric films. In this regard, special attention was paid to appropriately consider the correct propagating modes occurring in the analyzed structures, and also to the scalability of the models for R and L.
Editor
Instituto Nacional de Astrofísica, Óptica y Electrónica
Fecha de publicación
13 de diciembre de 2017
Tipo de publicación
Tesis de doctorado
Versión de la publicación
Versión aceptada
Recurso de información
Formato
application/pdf
Idioma
Inglés
Audiencia
Estudiantes
Investigadores
Público en general
Sugerencia de citación
Cortés-Hernández DM
Repositorio Orígen
Repositorio Institucional del INAOE
Descargas
4154