Título

Quantification of phase content in TiO2 thin films by Raman spectroscopy

Autor

Victor Hugo Castrejón Sánchez

Edgar Enrique Camps Carvajal

MIGUEL ANGEL CAMACHO LOPEZ

Nivel de Acceso

true

Acceso Abierto

Licencia

http://creativecommons.org/licenses/by-nc-nd/4.0

Materias

Física, Astronomía y Matemáticas - ([Superficies y vacío (México) Num.3 Vol.27]) Anatase-rutile TiO2 Raman spectroscopy Reactive sputtering - ([Superficies y vacío (México) Num.3 Vol.27]) CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA - (CTI)

Resumen o descripción

Recently, it has been reported that TiO2 with mixture of phases (anatase/rutile) exhibit higher photocatalytic activity than TiO2 with pure anatase phase. Therefore, the production and correct quantification of the ratio of phases becomes an important task. In this work, anatase TiO2 thin films were obtained by the DC reactive magnetron sputtering technique. TiO2 with mixture of phases (anatase/rutile) were prepared by thermal annealing of the as-deposited thin films. The value of the anatase/rutile ratio in the titanium dioxide thin films was estimated using Raman spectroscopy. Additionally, it is reported the dependence of the bandgap of the TiO2 thin films as a function of the anatase/rutile ratio. The band gap of the TiO2 thin films was determined from diffuse reflectance measurements.

Editor

Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.

Fecha de publicación

2014

Tipo de publicación

Artículo

Recurso de información

http://hdl.handle.net/20.500.11799/39994

Formato

application/application/pdf

Fuente

Superficies y vacío (México) Num.3 Vol.27

Idioma

Inglés

Relación

http://www.redalyc.org/revista.oa?id=942

Audiencia

Estudiantes

Investigadores

Repositorio Orígen

REPOSITORIO INSTITUCIONAL DE LA UAEM

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