Título
Pathological element-based active device models and their application to symbolic analysis
Autor
CARLOS SANCHEZ LOPEZ
ESTEBAN TLELO CUAUTLE
Nivel de Acceso
Acceso Abierto
Materias
Current conveyors - (CURRENT CONVEYORS) Nullor - (NULLOR) Operational amplifiers - (OPERATIONAL AMPLIFIERS) Pathological elements - (PATHOLOGICAL ELEMENTS) Symbolic nodal analysis - (SYMBOLIC NODAL ANALYSIS) CIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA - (CTI) FÍSICA - (CTI) ELECTRÓNICA - (CTI) ELECTRÓNICA - (CTI)
Resumen o descripción
This paper proposes new pathological element-based active device models which can be used in analysis tasks of linear(ized) analog circuits. Nullators and norators along with the voltage mirror-current mirror (VM-CM) pair (collectively known as pathological elements) are used to model the behavior of active devices in voltage-, current-, and mixed-mode, also considering parasitic elements. Since analog circuits are transformed to nullor-based equivalent circuits or VM-CM pairs or as a combination of both, standard nodal analysis can be used to formulate the admittance matrix. We present a formulation method in order to build the nodal admittance (NA) matrix of nullor-equivalent circuits, where the order of the matrix is given by the number of nodes minus the number of nullors. Since pathological elements are used to model the behavior of active devices, we introduce a more efficient formulation method in order to compute small-signal characteristics of pathological element-based equivalent circuits, where the order of the NA matrix is given by the number of nodes minus the number of pathological elements. Examples are discussed in order to illustrate the potential of the proposed pathological element-based active device models and the new formulation method in performing symbolic analysis of analog circuits. The improved formulation method is compared with traditional formulation methods, showing that the NA matrix is more compact and the generation of nonzero coefficients is reduced. As a consequence, the proposed formulation method is the most efficient one reported so far, since the CPU time and memory consumption is reduced when recursive determinant-expansion techniques are used to solve the NA matrix.
Editor
IEEE
Fecha de publicación
2011
Tipo de publicación
Artículo
Versión de la publicación
Versión aceptada
Recurso de información
Formato
application/pdf
Idioma
Inglés
Audiencia
Estudiantes
Investigadores
Público en general
Sugerencia de citación
Sánchez-López, C., et al., (2011). Pathological element-based active device models and their application to symbolic analysis, IEEE Transactions on Circuits and Systems I: Regular Papers, Vol. 58 (6): 1382-1395
Repositorio Orígen
Repositorio Institucional del INAOE
Descargas
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