Título
Structural and Mechanical Characterization of Hi-Nicalon Fibers
Autor
IRENE LUJAN REGALADO
JESUS ANTONIO BENCOMO CISNEROS
KARLA CAMPOS VENEGAS
Ricardo Martínez Sánchez
JOSE MARTIN HERRERA RAMIREZ
Nivel de Acceso
Acceso Abierto
Materias
Resumen o descripción
The need of reinforcements for structural ceramic matrix composites to be used in air at
temperatures above 1000°C has encouraged great changes in small-diameter ceramic fibers since
their initial development as refractory insulation [1]. A very important type of ceramic fibers for
structural reinforcement are the Hi-Nicalon fibers, which are oxygen free SiC fibers that have been
commercially produced by an electron beam curing process [1]. The Hi-Nicalon fiber has higher
elastic modulus and thermal stability and better creep resistance than the Nicalon fiber. Hi-Nicalon
fibers are also highly resistant to oxidation and chemical attack. The performance of any ceramic
matrix composites is highly dependent upon the properties of the reinforcement, which make
important studying the mechanical behavior of these fibers. The objective of the present work was to
evaluate the tensile behavior of single Hi-Nicalon fibers at room temperature using a Universal Fiber
Tester [2], equipped with a load cell of 250 g calibrated from 0 to 100 g, with a precision of 0.01 g.
The specimen gauge length was 30 mm and the fiber was gripped between two sets of jaws, the
strain speed used for the tests was 4.05 x 10-3 s-1. Data acquisition used a PC linked to the fiber tester
via a National Instrument interface card and WinATS 6.2 software from Sysma. In order to
normalize the stress, the diameter of the tested fibers was systematically measured before each test
by using a Mitutoyo LSM-500S laser apparatus, with an accuracy of 0.01 μm. Scanning electron
microscopy (SEM) characterization was performed using a JEOL JSM7401F microscope operated at
2 kV. Samples were prepared by focused ion beam (FIB) in a JEOL JEM 9320-FIB microscope
operated at 30 kV and 25 mA, and analyzed by transmission electron microscopy (TEM) in a JEOL
JEM-2200FS microscope operated at 200 kV.
Fecha de publicación
2012
Tipo de publicación
Memoria de congreso
Versión de la publicación
Versión enviada
Recurso de información
Formato
application/pdf
Idioma
Inglés
Repositorio Orígen
Fuente de Objetos Científicos Open Access
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